Abstract

The MIL-STD-883 Procedure 5012, Fault Coverage Measurement for Digital Microcircuits, is reviewed. Procedure 5012 specifies a standard fault set and fault coverage calculation techniques. The motivation and benefits of the standard are detailed. The effect of the standard fault set is studied by analysis and presentation of test case data. An actual example illustrates the costs of generating a compliant fault coverage report. US Department of Defense contractors, fault simulation developers, and semiconductor vendors are encouraged to create the necessary supporting infrastructure for the new standard. >

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