Abstract
The authors present an efficient method for computing uniform testability measures for combinational and sequential circuits. The initiability measure is a quantification of the difficulty to initialize a sequential module. With this testability measure, the fault coverage can be estimated and the test point insertion can be done. The authors show how initiability and a model of a sequential circuit under test give a uniform representation of testability measures for combinational and sequential modules. This can be achieved by converting a sequential module to a combinational one. They discuss TMs at different stages of design. Functional-level initiability and gate-level initiability are discussed. This method is proven to be efficient in the quantification of testability measures and fault coverage. >
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