Abstract
This paper proposes a unified capacitors stress emulation method, which has two unique test capabilities: 1) concurrent electrical stress emulation to AC capacitors and DC capacitors; 2) different electrical stress levels (including different ripple current, ripple voltage, and DC voltage) can be individually controlled for the testing samples. It preserves the advantages of a recently reported method with a minimum required power supply and is robust to testing sample degradation. This method is suitable for application-oriented stress emulation testing with different types of DC / AC capacitors and multiple electrical stresses in high power converter systems. The circuit architecture and testing ability of this method are presented. Moreover, analytical models are derived to size the key components to realize various testing requirements. Proof-of-concept experimental results are presented to verify the feasibility of the proposed test method.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
