Abstract

This paper proposes a capacitor testing method that can concurrently emulate the electrical stresses of both AC and DC capacitors for high-power converter applications. It preserves the advantages of a recently reported method with a minimum required power sup-plies and is robust to testing sample degradation, which, however, limits to test either AC or DC capacitors. The circuit architecture and application examples are presented. Experimental results verify the feasibility and effectiveness of the proposed testing method.

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