A Robust Testing Method for DC and AC Capacitors With Minimum Required Power Supply

Abstract

This letter proposes a testing method to emulate realistic stress conditions of dc and ac capacitors, with minimum required power supply and robust operation at the presence of capacitor degradation. It is especially suitable for parameter characterization and accelerated degradation testing of high-voltage and high-ripple current power electronic capacitors. The circuit architecture of the proposed testing method and the constraints of the testing samples under given designs are discussed. Proof-of-concept experiments on both dc and ac capacitors verify the feasibility.