A true random number generator that utilizes thermal noise in a programmable system‐on‐chip (PSoC)

Abstract

SummaryThis study presents four designs for a true random number generator (TRNG) for Cypress programmable system‐on‐chip (SoC) (PSoC) devices, whose entropy source is the thermal noise of resistors. The first design includes a ΔΣ analog‐to‐digital converter (ADC) with two external resistors of 6 MΩ, where the resolution was set to 16 bits. The second, third, and fourth designs adopt the internal resistors of a programmable gain amplifier (PGA) as a noise source. The second design adopts a single‐stage PGA (gain 50) with a ΔΣ ADC, while the third design adopts a two‐stage PGA (gain 50 × 50) with a ΔΣ ADC. The fourth design adopts a trans‐impedance amplifier (TIA) with a ΔΣ ADC. All four designs have passed the National Institute of Standards and Technology (NIST) test suite.