Abstract
Angle-resolved X-ray photoelectron spectroscopy (ARXPS) measurements were made on a polystyrene sample that had been exposed to a nitrogen plasma. It was observed that both oxygen and nitrogen were present in the sample surface, and that both were lost over a period of 5 h under X-ray irradiation in the vacuum of the spectrometer. The ARXPS data sets were corrected for the time displacement between consecutive measurements at different photoemission angles, and fitted with boxcar models in order to extract simple nitrogen and oxygen concentration depth profiles, consistent with the data, as a function of time. Both depth profiles were found to evolve in a consistent manner, indicating a loss of both the average concentration and thickness in the oxygen profile, and a stable concentration but similar loss of thickness in the nitrogen profile.
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