Abstract
This chapter presents a test of the effect of scattering on the f factor used in the internal-external conversion (IEC) method. Several investigators utilizing the IEC method for conversion coefficient determinations have questioned the possible effect of photoelectron scattering on the f factor employed in this procedure. The f factor is related to the photoelectron distribution from an external converter and a scattering distortion in this distribution for low energies and thick converters is expected. The chapter illustrates the dependence of the calculated, scatter-corrected f factors on converter thickness for the particular source-converter configuration used and for a photon energy of 300 keV. The trend exhibited by the experimental results disagrees with that of the theoretical scatter-corrected f factors. Because of the general applicability of the IEC method, it is important that more experimental and theoretical work be done to resolve this contradiction.
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