A Tellegen's theorem approach to the fault diagnosis of general analog circuits

Abstract

An exposition of a fault-diagnosis procedure for general analog circuits is presented. This procedure can handle circuits of a wide variety of elements including the non-reciprocal, active, and two-port types. It can diagnose multiple soft faults as well as most catastrophic faults. Its characteristics approximate those of practical in situ testing, and it requires moderate linear computations that are mostly off-line.