A survey on defect and noise detection and correction algorithms in image sensors

Abstract

This paper presents a survey on various novel defect and noise detection and correction algorithms used in CMOS image sensors. This class of sensors is extremely relevant in number of applications in the areas of gaming, security, medical, automotive, high-end camera market, etc. This survey outlines the algorithms and the hardware implementation of novel defect and noise detection and correction schemes to detect and correct defective pixels, and discusses their performance and advantages in terms of their applications. Experimental results on various images illustrate the capabilities of the studied approaches.