Defect Detection and Recognition Algorithm of Capacitive Touch Panel ITO Circuits

Abstract

As the most widely used human-computer interaction media, capacitive touch panel (CTP) is widely applied to tablets, smartphones and ATM devices, meanwhile, the design of indium tin oxide (ITO) circuits has a decisive impact on the performance of equipment, therefore, the defect detection of ITO circuits is particularly important. With the rapid development of computer technology and digital image processing technology, automatic optical detection technology has been widely used in production and manufacturing, and defect detection algorithm is the core of Automatic Optic Inspection (AOI). Aiming at the pattern of typical CTP ITO circuit, this paper proposed a defect detection and recognition algorithm based on reference comparison and count defect boundary change value. By constructing the corresponding AOI, the paper proved that the algorithm can extract the defects of ITO circuits accurately and identify the extracted defects, which has practical value.