A surface-potential based drain current model for short-channel symmetric double-gate junctionless transistor

Abstract

Junctionless transistors, which do not have any pn junction in the source-channel-drain path have become an attractive candidate in sub-20 nm regime. They have homogeneous and uniform doping in source-channel-drain region. Despite some similarities with conventional MOSFETs, the charge-potential relationship is quite different in a junctionless transistor, due to its different operational principle. In this report, models for potential and drain current are formulated for shorter channel symmetric double-gate junctionless transistor (DGJLT). The potential model is derived from two dimensional Poisson's equation using "variable separation technique". The developed model captures the physics in all regions of device operation i.e., depletion to accumulation region without any fitting parameter. The model is valid for a range of channel doping concentrations, channel thickness and channel length. Threshold voltage and drain-induced barrier lowering values are extracted from the potential model. The model is in good agreement with professional TCAD simulation results.