Abstract
In order to investigate plasma-surf ace interactions, a surface analysis station and its attachment devices, a vacuum suitcase and a high temperature test stand have been designed and constructed. Silicon samples were transferred into the JIPP T-IIU torus by a driving shaft of the surface analysis station and set in the scrape-off layer. After exposure to the plasma with 200 kW ICRH during several tens of shots, the samples were drawn out to be observed by in situ AES in the analysis chamber of the surface analysis station. Spatial profiles of impurities and deuterium in the scrape-off layer were obtained by AES and NRA. The decrease of C and D as well as the increase of O are found on the ion side sample by these analyses. Based on these data, the role of the vacuum suitcase and the high temperature test stand in relation to the surface analysis station is briefly mentioned.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
