Abstract
Abstract EPMA, AES and XPS experiments have been performed on silver and copper fast ion conductors. In the EPMA and AES experiments, under the action of the electron beam the mobile cation in the fast ion conductors moved towards the beam bombardment point. On the other hand, the anions moved away. It was found that the apparent silver and copper contents increased with bombardment time, as deduced from the silver and copper X-ray counts on the Auger peak-to-peak intensity. There was an opposite effect for XPS. The patterns of crystallization for the silver specimen in EPMA are discussed. Morphological observation of the silver and copper distribution on ion conducting glasses after electron bombardment reveals the interrelation between silver and copper ion transport characteristics and the microstructures.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
