Abstract
Glancing angle X-ray techniques have been used to characterise yttrium-containing Ni-20Cr alloys during the initial stages of oxidation at 700°C. A direct comparison is made between the oxide dispersoid strengthened alloy MA 754 (Ni-20Cr containing 0.6 Y 2O 3) and a Ni-20Cr alloy subjected to yttrium ion implantation at a dose of 1 × 10 17 ions cm −2. Depth profiling of samples corroded from 1 to 8 min using glancing angle X-ray diffraction was used to identify the initial phases developed as a function of depth. EXAFS (extended X-ray absorption fine structure) studies at the Cr K-edge complemented the diffraction data and also gave an indication of the degree of disorder in the fee lattice after implantation with yttrium, and its rearrangement on initial heat treatment.
Published Version
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