Abstract
The carbon nanotube (CNT) probe, where a multi-walled (MW) CNT is attached onto the tip apex of a commercial silicon nitride cantilever, is applied to study friction on the nanometer scale using contact atomic force microscope (AFM). The friction versus load curve using CNT tip shows a completely different behavior from that of conventional tip, which is ascribed to the unique shape of CNT. In addition, strong scanning length dependency of the friction force is found due to the deformation of CNT.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
