Abstract
Synchrotron Light Sources must operate in the Ultra High Vacuum (UHV) region (10 −9 mbar) in order to obtain satisfactory stored electron beam lifetimes. To achieve this requires meticulous attention to cleanliness. Previous work has been reported (J D Herbert et al., J Vac Sci Technol, A12, 1767 (1994)) in which various methods of chemical cleaning of contaminated stainless steel samples were shown to produce surfaces with suitably low thermal outgassing rates. The dominant source of gas production in a light source is, however, photon stimulated desorption (PSD). Therefore any satisfactory cleaning process must produce surfaces with a suitably low coefficient of PSD, i.e. the number of gas molecules emitted per incident photon. In this article results for the analogous process of electron stimulated desorption (ESD) for surfaces cleaned as previously reported (J D Herbert et al., J Vac Sci Technol, A12, 1767 (1994)), are presented. These results have permitted the establishment of a satisfactory routine cleaning process that is suitable for light sources.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
