Abstract
Presents a structural approach to the analysis of polycrystalline thin films and cells using physical lumped models. It was observed that although in theory the film mobility is proportional to the ratio of the grain to intergranular dimensions, this dependence was insufficient to explain the measured changes in mobility. Equivalent circuit models were also set up to consider the photovoltaic effects for three commonly observed film structures. Two limiting instances were identified corresponding to conditions of 'insulating grain boundaries' and 'leaky boundaries'. For the CuxS-CdS cells examined, the 'insulating grain boundaries' condition appeared more in line with experimental observations.
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