Abstract
Approximately stoichiometric InP films have been prepared over a range of substrate temperature . The structure of the deposited films has been investigated by means of transmission electron microscopy (TEM), extended x-ray absorption fine structure (EXAFS) and x-ray photoelectron spectroscopy (XPS) experiments. TEM measurements reveal that samples deposited below approximately are amorphous while films prepared above this temperature are microcrystalline in nature. Both EXAFS and XPS measurements indicate that bond angle disorder in the atomic network decreases as is raised. Changes in the optical absorption properties are observed as is increased, with particularly marked changes noted over the relatively narrow temperature range ; the bandgap (defined as the photon energy at which the absorption coefficient is equal to ) increases from 1.1 to 1.25 eV while n(0.5) (the refractive index at 0.5 eV photon energy) decreases from 3.7 to 3.3 over the above temperature range. The changes in optical properties are correlated with the structural data.
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