A solid state detector for soft energy extended x-ray absorption fine structure measurements

Abstract

Following the success of solid state detector systems for extended x-ray absorption fine structure studies at high x-ray energies, there is now an increasing demand for similar devices capable of operating in the soft x-ray energy range below about 3 keV. Recent developments in sophisticated detector fabrication techniques now make the construction of specialized devices, suitable for high quality spectroscopy in this energy range, a practicable proposition. We present the results of extensive testing of a new detector developed specifically for use in the sub-3 keV energy range. We have measured energy resolutions of less than 125 eV full width at half maximum at sulfur and silicon Kα energies and the ability of the detector to achieve this resolution at the copper Lα line has also been shown. Finally we demonstrate the potential of this device in a study of trace dopants in bulk silicon based quantum dot glasses.