Abstract
A simple Xray spectrometer and a PCBased Data Acquisition System(DAS) have been developed newly in Shanghai Institute of Applied Physics(SINAP), Chinese Academy of Sciences(CAS) for the measurement of the Xray source generated using laser Compton scattering. The system consists of liquid nitrogen cooled high resolution Si(Li) detector, electronics and a DAQ. The Si(Li) detector was designed and made by Center of Advanced Instruments in SINAP, CAS， it allows us to measure Xrays with the energy up to 60 keV and the energy resolution(FWHM) of 184 eV at 5.9 keV. We measured the system uncertainty was 0.2 eV and time drifting of detector was 0.05% both at 5.9 keV. The DAQ was based on ObjectOriented software LabVIEW 7.1, it has data online analysis and original data saved functions.
Published Version
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