Abstract
AbstractTwo simple techniques are described for eliminating overlapped intense Auger signals from electron energy loss spectrum. One is performed by superimposing a small oscillation on both the sample and the CMA band pass energy and detecting only signals which are not altered by the modulation, the other is performed by applying large bias voltage to the sample. These techniques can be used to extract the low energy reflection mode extended electron energy loss fine structure (EXELFS) signals.
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