A Simple Measurement Technique for Critical Current Density by Using a Permanent Magnet

Abstract

We developed a novel nondestructive and contactless method for measurements of critical current density (J/sub c/) in high-temperature superconductor (HTS) thin films by using a permanent magnet (Sm/sub 2/Co/sub 17/). This measurement technique is based on a repulsive force (F/sub r/) and attractive force (F/sub a/) between the magnet and HTS film caused by the shielding currents and pinning forces. The F/sub r/ and F/sub a/ were measured by using a high-resolution load sensor changing the distance (L) between the magnet and HTS film. An effective maximum repulsive force (F/sub m,eff/) could be determined from an extrapolated value of the F/sub r/ vs. L curve for L=0 mm. We investigated the relationship of the J/sub c/ to the F/sub m,eff/ in many HTS (YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// and ErBa/sub 2/Cu/sub 3/O/sub 7-/spl delta//) samples. The standard J/sub c/ of HTS films was measured by using an inductive measurement system produced from THEVA GmbH. We found that the J/sub c/ is almost proportional to the two-thirds power of the F/sub m,eff/ normalized by the film thickness. This result indicates that the simple permanent magnet technique can be easily estimate the J/sub c/ of the HTS films. This system has good reproducibility for the J/sub c/ measurements and is useful to provide a rapid, routine characterization of the superconductivity in the HTS materials.