Abstract
A simple valid in situ relative intensity calibration technique for soft x-ray film is described. This is based on film exposure measurements of the uniform line-shaped distributed soft x-ray monochromatic irradiation transmitted through a step-wedge absorption filter. Fitting the calibration data with Henke’s semiempirical equation for thick-emulsion film, the characteristic curves for Shanghai 5F soft x-ray film without supercoat (SIOM-5FW) have been obtained in the wavelength region from 50 to 80 Å.
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