Abstract
A silicon microstrip detector with capacitive coupling of the diode strips to the metallization and with individual polysilicon resistors to each diode has been developed. The detector was tested in a minimum ionizing particle beam showing a performance similar to conventional strip detectors and a spatial resolution of 3.5 μm. Capacitive coupling allows the decoupling of the leakage current from the input to the charge sensitive preamplifier especially in the case of LSI electronics.
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