Abstract

In this work, a characterization procedure of Artificial Magnetic Conductor (AMC) metasurfaces based on analytical expressions developed using the Generalized Boundary Conditions (GBCs) model is presented. The correlation between the surface susceptibilities of the PEC scatterers and the main frequency points used in the characterization of AMCs are established. Then the susceptibilities of square patch, square loop, Jerusalem cross and second iteration Minkowski fractal PEC scatterers are obtained by two sets of simulations and are used to calculate profiling frequencies and stability parameters. The detailed characterization procedure is presented and the flexibility and effectiveness of the proposed method are compared to full-wave numerical simulations.

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