Abstract
A key compromise in selective plane illumination microscopy (SPIM) is the tradeoff between optical confinement, axial resolution, and field of view (FOV). Recent advancements have demonstrated that high axial resolution can be maintained over a large FOV by optical engineering of the light sheet or by scanning the thinnest portion of a Gaussian focus across the FOV. These methods require precise synchronization between the translating focus of the exciting Gaussian to the programmable shutter of a scientific CMOS camera.
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