Abstract
Abstract The experimental data of Mozzi and Warren have boon re-evaluated. One of the numerical constants in the analytical technique has been altered and a continuous analytical distribution function has boen substituted for the discrete or non-analytical distributions of interatomic distances used by Mozzi and Warren. Thoir overall conclusions are not altered, but new values are obtained for some of the structural parameters. The most probable Si-O-Si bond angle is found to be 152° instead of 144°. This value is in good agreement with the findings of Bell and Dean who were unable to construct a successful model with 144°, but found satisfactory agreement with 153°.
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