Abstract
Recently, the grain scale modeling has gained much attention in the area of properties characterization, processing and application for polycrystalline materials at micro-nanometer level. In order to develop the high-quality grain scale representative volume element (RVE) models for polycrystalline materials, this paper proposes a pseudorandom based crystal plasticity finite element (CPFE) modeling method, which can take full advantage of true grain scale information and generate pseudorandom grains. Further, the uniaxial tension experiments, EBSD copying modeling method and Voronoi modeling method, were used to validate the proposed pseudorandom based CPFE modeling method. Results show that the Pseudorandom model is better than existing advanced grain scale RVE models in terms of simulation efficiency, representativeness, strain rate stability, mesh density stability and truth proximity. In the end, this research provides a better grain scale RVE modeling method and can promote the progress of material characterization, processing and application for polycrystalline materials at micro-nanometer scale.
Published Version
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