Abstract
A scheme for avoiding delay faults with slack assessment during standby time is proposed in this paper. The proposed scheme performs path delay testing and checks if the slack is larger than a threshold value using selectable delay embedded in basic elements (BE) on a coarse-grained reconfigurable device. If the slack is smaller than the threshold, a pair of BEs to be replaced, which maximizes the path slack, is identified. Experimental results show that for aging-induced delay degradation a small threshold slack, which is less than 1 ps in a test case, is enough to ensure the delay fault prediction.
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