A Novel Test Pattern Optimization Approach Based on Ring Oscillator Network

Abstract

Fabless semiconductor industry and government agencies have major impact on the security and trustworthiness of the integrated circuits (IC) underlying the sensitive fields and critical applications. Hardware Trojan has arisen more attentions to its detection and prevention methods in the recent years. In order to ensure the reliability and trustworthiness of integrated circuits, we propose a novel test pattern optimization approach based on ring oscillator network, which can select an optimal test pattern sets to maximize the switching activity of the sub-region. An optimal test pattern sets we select using this approach can efficiently activate the hardware Trojan inserted into this sub-region. Meanwhile, we exert these test patterns to circuit under test separately and perform side channel analysis to distinguish the minor difference of dynamic power between the trusted and un-trusted chips. In this paper, we have set up an automatic test platform to carry out side-channel analysis experiment. Experimental results demonstrate that we can easily achieve about 0.8 % Trojan detection resoultion.