Abstract
A method to measure the propagation loss of optical waveguides is discussed. The measurement system involves two 3dB couplers, a CCD camera and a signal processing unit. The propagation loss measured from this technique is found to be independent of coupling conditions. The propagation properties of waveguides prepared by proton exchange (PE) in lithium niobate (LiNbO/sub 3/) and silver ion exchange in BK7 glass substrates are examined. Finally the variation of mode propagation loss for various annealing parameters of PE waveguides is discussed.
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