Abstract
This paper presents a new technique to accurately measure the data retention voltage (DRV) of large SRAM arrays in the presence of process variations. The proposed technique relies on a built-in-self-test (BIST) unit along with a DC-DC converter. The BIST unit implements a modified version of the March C-test that accounts for data retention faults. Whereas, the DC-DC converter is used to scale down the supply voltage of the array as is done when the array is in data retention mode. The proposed technique can accurately measure the DRV to ensure the SRAM operates at its minimum energy point. The circuit was developed in 90nm technology and simulated using HSPICE. Monte-Carlo simulation of 100k samples determined the DRV as 150mV whereas the proposed technique showed that the DRV of the SRAM under test could be lowered to 80mV which would result in significant power savings.
Published Version
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