Abstract
A novel method for precise measurement of complex reflection coefficient using a four-port reflectometer is presented. First, three new complex system constants are introduced, which depend only on the scattering parameters of the four-port reflectometer. Therefore, the stability of the reflectometer is greatly improved. Then, these complex system constants are used to determine the complex reflection coefficient Γ of the device under test by calibrating the reflectometer. Finally, a four-port reflectometer comprising a magic tee and a power detector is constructed and excellent experimental results are obtained.
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