Abstract
This paper reports a novel new measurement technique developed to measure microwave frequency performance of nanoscale devices. Typically, nanoscale devices are high impedance making them difficult to measure at RF. To circumvent this problem, we have developed a new technique in which we perform a two-tone test on a device operated in compression and observe the output at the difference frequency. We use this technique to verify the operation of a carbon nanotube based Field effect transistor (FET) at frequencies up to 23 GHz.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
