Abstract

In this paper we propose a novel deep-oxide trench SOI-LIGBT (DTPL SOI-LIGBT) with a deep P-Pillar layer in the drift region. The device can not only shorten the device cell pitch but also improve the breakdown voltage simultaneously. Particularly, it offers a fast extraction path for the hole current during turn-off, and in result shows significant improvement in the on-state and switching trade-off.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.