Abstract
+ 1, an across-level ratio can be estimated to verify the irregularity of an edge pixel. That is, an edge pixel is classified as strongly irregular (e.g. potential open or short defects) if its across-level ratio reaches a predefined threshold. The proposed approach is template-free and easy to implement, so it is suitable for small-batch production. Real BGA substrates with synthetic boundary defects are used as test samples to evaluate the performance of the proposed approach. Experimental results show that the proposed method is capable of capturing all the open and short defects on BGA substrate conducting paths without missing any errors by using a selected across-level ratio threshold and appropriate decomposition level.
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