Abstract
Abstract A change from conventional transmission electron microscopy to scanning transmission electron microscopy (STEM) does not increase the usable foil thickness of gold, the dominant inelastic scattering mechanism being phonon excitation. If the expected improvements for light-element materials in the STEM mode transpire, then for increased usable foil thickness, high-voltage electron microscopy and STEM will form complementary techniques with respect to specimen atomic weight.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
