Abstract
A new technique, using an Imaging Plate (IP) detector, was developed for the observation of X-ray crystal truncation rod (CTR) scattering. The use of an IP detector in conjunction with a synchrotron-radiation (SR) source is very effective for the observation of CTR scattering. The advantages and disadvantages of this technique are indicated by examples of the observation of CTR scattering from various samples: a naturally oxidized surface of an Si(111) wafer; MBE-grown GaAs/AlAs/GaAs on GaAs(001) substrate; Al-capped GaAs on an Si(111) substrate; and a cleavage NaCl(001) surface. It is also shown that it is possible to convert the observed intensity of the CTR scattering to an absolute scale if a stationary photograph is taken.
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