Abstract
A novel testing technique for TAB (tape-automated-bonding) LSIs operating in the gigahertz-frequency range is described. A TAB tape is sandwiched between test tools in order to compose a stripline configuration during testing. This technique allows the testing frequency range to be dramatically extended by reducing reflection noise caused by impedance mismatch between the test leads and the test sets. Maximum testing bit rate reaches 5 Gb/s, which is 2.5 times greater than that of the conventional technique. >
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