Abstract
A new experimental method has been used for measuring electron impact differential excitation functions when using a spectrometer fitted with a position sensitive detector. This technique can be easily implemented and results in a large increase in sensitivity, with no loss of information. A general derivation is given which facilitates calculation of the gain in sensitivity independent of the type of dispersive elements used or the exact nature of the spectroscopy being performed. The technique helps to reduce space charge problems associated with preparation of the incident electron beam.
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