Abstract

A new super junction (SJ) VDMOS with an extended high permittivity (HK) dielectric-filling trench is proposed. A narrow N/P column in the SJ structure can be realized by using trench technology and angled ion implantation. The assistant depletion caused by the HK dielectric increases doping concentration of the N-drift region and thus reduces the specific on-resistance (R on, sp ). Furthermore, HK dielectric weakens the charge balance sensitivity to the N-drift doping. The HK dielectric also reshapes the electric field distribution so as to improve the breakdown voltage (BV). Blocking and on-state characteristics have been investigated by simulation. The HK trench SJ VDMOS reduces R on, sp by 50% and increases BV by 12% compared with those of the conventional SJ VDMOS.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.