Abstract
ABSTRACTA new method of identifying the interfacial structure in the type-B CoSi2//Si(l11) bicrystal is presented. It involves using the kinematic structure factor equation to calculate the levels of contrast which will arise in darkfield micrographs due to steps at the interface. These are then matched to the levels of contrast measured directly from experimental images using an optical densitometer. By analysing the contrast levels measured from the same region of the bicrystal in both g=400B-aCos2 and g=111B-aCos2 micrographs, it is shown that the experimental resultsare consistent with the 7-fold coordinated interfacial structure.
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