Abstract
A new method for the characterization of integrated circuits immunity is presented in this paper. The substantial evolution of the resistive radio frequency injection probe (RFIP) test method is introduced. Measurement setup characterization is discussed along with the technique’s limitations. The method is also validated through different measurements, particularly on an analog-to-digital converter embedded in a microcontroller. RFIP measurement results are compared with results of other measurement techniques, including vector network analyzer, direct power injection, and differential RF probe.
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