Abstract
Time response is an important performance characteristic for gas-pressurized ionization chambers. To study the time response, it is especially crucial to measure the ion drift time in high pressure ionization chambers. In this paper, a new approach is proposed to study the ion drift time in high pressure ionization chambers. It is carried out with a short-pulsed X-ray source and a high-speed digitizer. The ion drift time in the chamber is then determined from the digitized data. By measuring the ion drift time of a 15atm xenon testing chamber, the method has been proven to be effective in the time response studies of ionization chambers.
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