Abstract

A new technique is proposed for an internal calibration of a two-layer detector assembly. Spatially coincident pairs of conical tracks on one surface and overetched tracks on the adjacent surface are selected for measurement. Both the etch rate ratio and the particle range can be obtained from the minor and major diameters of the elliptical track and the radii of the circular tracks for two etching steps. This technique was applied to CR-39 detectors exposed to fast neutrons and those flown on a high altitude balloon in order to evaluate the proton response. An improvement by using multi-step etching was also carried out. It was found that not only a single set of the etch rate ratio and the range but also the response curve could be estimated in an extended region by analyzing combined growth curves.

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