Abstract
In this paper, a new method for the static test of analog-to-digital converters (ADCs) is proposed. This method uses a variable step size calculated by using an extrapolated convergence factor method. It is shown that it speeds up dramatically the static characterisation procedure and that it could substitute with advantage the traditional static test procedure, especially when a small step size is used. Results obtained by different methods as a function of the step size, of the number of samples and of the relation between the ADC resolution and the expected standard deviation of the noise present in the experimental setup, are shown.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
