Abstract

This paper presents a monolithic vernier-based time-to-digital converter with 37.5 ps time resolution and theoretically unlimited input range. A single-stage Vernier delay line is used for both coarse and fine measurement. The operation frequencies of Vernier delay line are stabilized by a novel dual phase-locked loops circuit. The proposed TDC successfully eliminates the element mismatch, input range limitation, external bias adjustment and complicated calibration problems. The measured DNL and INL are plusmn0.2 LSB and plusmn0.35 LSB respectively. The chip size is merely 0.222mm2 in a 0.35-mum CMOS process

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