Abstract

A modular design and test approach for a family of VLSI MPUs: D Braune, A Guerin, J Labrousse (Int. Microelectron. Support Center, Fontenay Aux Roses, France) 1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC. First Edition, New York, USA, 25–27 Feb. 1987 (Coral Gables, FL, USA: Lewis Winner Feb. 1987), pp. 90–91, 353

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