Abstract
The dielectric properties of thin films can be modified relative to the bulk material because the interaction between film and substrate influences the mobility of the atoms or molecules in the first layers. Here we show that a strong scale effect occurs in nanometer size octadecylammine thin films. This effect is attributed to the different distribution of molecules depending on the size of the film. To accurately describe this effect, we have developed a model which is a reinterpretation of the linearized Thomas-Fermi approximation. Within this model, we have been able to characterize the polarizability of thin films independently of the thickness of the film.
Highlights
The ability to control electronic properties of a material at the nanoscale is at the heart of modern science
By using Electrostatic Force Microscopy (EFM) we demonstrate here that a very high effect of the scale can been found when the size of thin films is smaller than a few nanometers
In this letter we have developed a simple method to obtain quantitative information about the dielectric properties of thin films, in the nanometer scale
Summary
A model for the characterization of the polarizability of thin films independently of the thickness of the film. We show that a strong scale effect occurs in nanometer size octadecylammine thin films This effect is attributed to the different distribution of molecules depending on the size of the film. To accurately describe this effect, we have developed a model which is a reinterpretation of the linearized ThomasFermi approximation. Within this model, we have been able to characterize the polarizability of thin films independently of the thickness of the film
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